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상세보기
- KISE Journal of Korean Institute of Surface Engineering
- Volume 37(3); 2004
- Article
상세보기
KISE Journal of Korean Institute of Surface Engineering 2004;37(3):175-178. Published online: Nov, 30, -0001
3가 크롬 박막 내의 극미세 결함 측정을 위한 중성자 소각 산란법의 적용
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선문대학교 신소재생명화학공학부;
초록
The size and number of nano-size defects of thin trivalent chrome layers were determined by small angle neutron scattering (SANS) without breaking the thin chrome layers. Most of defect size of the trivalent chromium prepared in this test conditions is in
키워드 Chromium-carbon;Trivalent chromium bath;Small angle neutron scattering;