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KISE Journal of Korean Institute of Surface Engineering 2004;37(4):220-225. Published online: Nov, 30, -0001
A new ion beam extraction system is designed using a simple ion mass filter and a micro mass balance and a QMS based detecting system. A quadrupole Mass Filter is used for selective ion beam formation from inductively coupled high density plasma sources w
키워드 QMS;Inductively coupled plasma;Ion beam;Etch;