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KISE Journal of Korean Institute of Surface Engineering 2008;41(6):287-291. Published online: Nov, 30, -0001
DOI : 10.5695/JKISE.2008.41.6.287
Reactively magnetron sputtered TiN films were deposited on Si wafers under varying bias voltage and characterized by X-ray diffraction, field-emission scanning electron microscopy and Nanoindentation. The films deposited under an Ar +
키워드 Reactive magnetron sputtering;TiN coating;Substrate bias;Microstructure;