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KISE Journal of Korean Institute of Surface Engineering 2022;55(5):247-260. Published online: Nov, 14, 2022
DOI : 10.5695/JSSE.2022.55.5.247
Since the first report on ferroelectricity in Si-doped hafnia (HfO2), this emerging ferroelectrics have been considered promising for the next-generation semiconductor devices with their characteristic nonvolatile data storage. The robust ferroelectricity
키워드 semiconductor; ferroelectric; memory device; atomic layer deposition; vacuum technology.