Aug, 31, 2024

Vol.57 No.4

학회 연락처

상세보기

  • KISE Journal of Korean Institute of Surface Engineering
  • Volume 55(5); 2022
  • Article

상세보기

KISE Journal of Korean Institute of Surface Engineering 2022;55(5):247-260. Published online: Nov, 14, 2022

반도체 소자용 산화하프늄 기반 강유전체의 원자층 증착법 리뷰

  • 이영환a,+, 권태규b,+, 박민혁a,b*
    a서울대학교 신소재공동연구소, b서울대학교 재료공학부
초록

Since the first report on ferroelectricity in Si-doped hafnia (HfO2), this emerging ferroelectrics have been considered promising for the next-generation semiconductor devices with their characteristic nonvolatile data storage. The robust ferroelectricity

키워드 semiconductor; ferroelectric; memory device; atomic layer deposition; vacuum technology.