The Development of Cl-Plasma Etching Procedure for Si and SiO$_2$
Kim, Jong-Woo;Jung, Mi-Young;Park, Sung-Soo;Boo, Jin-Hyo;
Center for Advanced Plasma Surface Technology, Sungkyunkwan University;Department of Physics, Sunmoon University;Department of Physics, Sunmoon University;Center for Advanced Plasma Surface Technology, Sungkyunkwan University;
초록
Dry etching of Si wafer and $SiO_2$ layers was performed using He/Cl$_2$ mixture plasma by diode-type reactive ion etcher (RIE) system. For Si etching, the Cl molecules react with the Si molecules on the surface and become chemically