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KISE Journal of Korean Institute of Surface Engineering 2002;35(2):107-112. Published online: Nov, 30, -0001
We have studied diffusion behavior of NiFe/Ag bilayer deposited by on silicon Ion Beam Sputtering methods. The diffusion behavior of NiFe and Ag in NiFe/Ag thin film is analyzed by Medium Energy Ion Scattering Spectroscopy. For samples without Ta underlay
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